33rd Annual IEEE International Computer Software and Applications Conference

Seattle,Washington, July 20 - July 24, 2009
           Co-located with IPSJ/IEEE SAINT 2009

Industrial Experience in Embedded Systems Design (IEESD 2009)

2nd IEEE International Workshop on
Industrial Experience in Embedded Systems Design (IEESD 2009)

Theme and Scope of the Workshop


The ongoing embedded revolution has actively influenced industrial activities. Automation, distribution, and ubiquity are only a few of the modern concerns, both in industrial environments as well as from a userís perspective. There is a strong trend towards increasing the level of interoperability, coupling with enterprise applications, multi-domain software design, and applying hardware/software co-design techniques. Application of new information and communication technologies, validation, protocol definition, horizontal and vertical integration may provide promising and innovative solutions, but also pose significant challenges that need to be addressed.

The aim of IEESD is to promote current practices and solutions in embedded systems design viewed from an industrial perspective. Papers are expected to cover (non-restrictively) one or more of the following topics:

  • Wireless communication protocols and their application in industry;
  • Applications of advanced embedded solutions in industrial automation;
  • Coupling of devices and enterprise applications;
  • Programming languages and frameworks;
  • Architectures, execution models and runtime platforms;
  • Model-based and model driven embedded development;
  • Software methods and tools;
  • System validation and testing.

Likely Participants

Likely participants of IEESD include researchers and practitioners in the area of embedded system design, favoring expansion of wireless communication, software development techniques, enterprise applications, and automation.

Important Dates

March 20, 2009: Workshop paper submissions due
April 15, 2009: Workshop paper notification (electronic)
April 30, 2009: All final manuscript and author pre-registration due


Both draft and camera-ready papers must be submitted electronically via the IEESD2009 Submission Page

Organizers and Program Committee

Tiberiu Seceleanu, ABB Corporate Research, Sweden
contact: Tiberiu.Seceleanu_at_se.abb.com

Detlef Streitferdt, ABB Corporate Research, Germany
contact: Detlef.Streitferdt_at_de.abb.com

Program committee:
Juha-Markus Aalto, Nokia, Finland
Arslan, University of Edinburgh, UK
Victor Bos, SSF, Finland
Armando Colombo, Schneider Electric, Germany
Jerker Delsing, Lulea University of Technology, Sweden
Robert Eschbach, Fraunhofer IESE, Germany
Kai Hansen, ABB Corporate Research, Norway
Axel Jantsch, Royal Institute of Technology, Sweden
Stamatis Karnouskos, SAP, Germany
Ulrich Meier-Noe, iXtronics, Germany
Stephan Pietsch, TestingTech, Germany
Ina Schieferdecker, Fraunhofer FOKUS, Germany
Cristina Seceleanu, Malardalen University, Sweden
Sakir Sezer, Queen's University Belfast, UK
Hannu Tenhunen, University of Turku, Finland
Anne E. Vallestad, ABB Corporate Research, Norway