The IEEE VAST Contest is a participation category of the IEEE VAST 2007 Symposium (part of IEEE VIS 2007). It continues in the footsteps of the VAST 2006 contest as its purpose is to promote the development of benchmark data sets and metrics for visual analytics, and to establish a forum to advance visual analytics evaluation methods. For details, click here.

Contest Co-Chairs
Jean Scholtz, Pacific Northwest National Laboratory
Catherine Plaisant, University of Maryland
Georges Grinstein, University of Massachusetts-Lowell