Arns, Laura	Purdue University
Baciu, George	Hong Kong Polytechnic University CN
Baxter, Bill	OLM Digital JP
Borst, Christoph	University of Louisiana at Lafayette
Bowman, Doug	Virginia Tech US
Chai, Young	Univ. of Chung-Ang
Chrysanthou, Yiorgos	University of Cyprus
Cole, Mary	Landmark Corporation
Coquillart, Sabine	INRIA FR
Dachselt, Raimund	Otto-von-Guericke-Universitat Magdeburg
Frahm, Jan-Michael	University of North Carolina at Chapel Hill US
Friedman, Doron	IDC
Frisoli, Antonio	Percro, Scuola Superiore Sant'Anna
Froehlich, Bernd	Bauhaus University Weimar DE
Hollerer, Tobias	Univ. of California at Santa Barbara
Ikei, Yasushi	Tokyo Metropolitan Institue of Technology JP
Interrante, Victoria	University of Minnesota US
Jorge, Joaquim	Instituto Superior Técnico PT
Julier, Simon	University College London
Kim, Gerard	Korea University
Kim, Young J.	Ewha Womans University KR
Kitamura, Yoshifumi	Osaka University JP
Klinker, Gudrun	Technische Universität München DE
Kuhlen, Torsten	RWTH Aachen University
Lau, Rynson	University of Durham UK
LaViola, Joseph	University of Central Florida
Lindeman, Robert	Worcester Polytechnic Institute
Livingston, Mark	Naval Research Laboratory
Lok, Benjamin	University of Florida US
Magnenat Thalmann, Nadia	University of Geneva
Monroe, Laura	Los Alamos National Lab
O'Sullivan, Carol	Trinity College Dublin IE
Otaduy, Miguel A.	ETH Zurich CH
Pan, Zhigeng	Zhejiang University
Raffin, Bruno	INRIA
Reiners, Dirk	University of Louisiana at Lafayette US
Roberts, David	University of Salford UK
Ryken, Michael	John Deere
Schmalstieg, Dieter	Graz University of Technology AT
Stefani, Oliver	COAT-Basel CH
Stuerzlinger, Wolfgang	York University of Toronto CA
Su, Simon	Lite 3D
Takemura, Haruo	Osaka University JP
Thalmann, Daniel	EPFL
Whitton, Mary	University of North Carolina at Chapel Hill US
Wu, Enhua	University of Macau & the Inst. of Software, Chinese Academy of Sciences (Academia Sinica) CN